Location: News >> MM-16
Spectroscopic Ellipsometer
MM-16: New Low Cost
Spectroscopic Ellipsometer for Advanced Thin Film Characterization
HORIBA Jobin Yvon, Thin Film Division, introduces the new MM-16, a highly accurate and sensitive low cost spectroscopic ellipsometer that extends the capabilities of classical ellipsometry. Along with measurements of thin
film thickness and optical constants, the MM-16 delivers in 2 seconds, the
complete 16 elements of the Mueller Matrix in the visible range. This
allows simple and easy characterization of anisotropy, complex birefringent
materials and degree of depolarization. These complex materials properties
are widely used in many applications such as display, biotechnology,
packaging and semiconductor areas.
The MM-16 completes the full range of ex-situ and in-situ ellipsometers such as the UVISEL, DigiSel and PZ 2000 manufactured by HORIBA Jobin Yvon. It benefits from many available options such as variable angle of incidence, motorized stage, integrated microspot reflectometer, liquid cell, heating stage and more.The powerful Windows based ellipsometry analysis software, DeltaPsi2, provides turnkey operation for a wide range of industrial and research applications.
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