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Location: News >> MM-16 Spectroscopic Ellipsometer
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MM-16: New Low Cost Spectroscopic Ellipsometer for Advanced Thin Film Characterization
MM-16 Spectroscopic EllipsometerHORIBA Jobin Yvon, Thin Film Division, introduces the new MM-16, a highly accurate and sensitive low cost spectroscopic ellipsometer that extends the capabilities of classical ellipsometry. Along with measurements of thin film thickness and optical constants, the MM-16 delivers in 2 seconds, the complete 16 elements of the Mueller Matrix in the visible range. This allows simple and easy characterization of anisotropy, complex birefringent materials and degree of depolarization. These complex materials properties are widely used in many applications such as display, biotechnology, packaging and semiconductor areas.

The MM-16 completes the full range of ex-situ and in-situ ellipsometers such as the UVISEL, DigiSel and PZ 2000 manufactured by HORIBA Jobin Yvon. It benefits from many available options such as variable angle of incidence, motorized stage, integrated microspot reflectometer, liquid cell, heating stage and more.The powerful Windows based ellipsometry analysis software, DeltaPsi2, provides turnkey operation for a wide range of industrial and research applications.

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