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For more details and information on HORIBA Jobin Yvon Thin Film Division products please complete the form below. You must enter information in the boxes with BLUE titles to submit the form.
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Please Send Product Information For:
General Ellipsometry
General In-Situ Process Control
Spectroscopic Ellipsometer from FUV to NIR
PlasmaScope
UVISEL
DigiCPM
MM-16
DigiLEM
In-situ ellipsometer
MultiCPM
Fully automated ellipsometer
Large area metrology platform
My Application is:
Laboratory Applications
Process Applications
Thin Film Metrology
EPD at Interfaces
Surface Chemistry
EPD at Depths
Reflectance Difference
Thicknesses
Semiconductors & Electronics
Refractive Indices
Polymers & Organic Films
Absorption Constants
Dielectrics
Flat Panel Displays
Conducting Materials
Dielectric & Transparent Film
Biological Films & Membranes
Real-time Monitoring
Optical Coatings
Ultra-thin Gate Oxide
Metals
Pulsed Plasma Monitoring
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