Quickly proceed from a view of the entire sample to the selection of the target point.

Just three clicks from a view of the entire sample to the selection of the point to be measured.

After the image of the entire sample is displayed on the monitor, you can select the exact point for high-precision 10 µm analysis in just 3 mouse button clicks.

• Single Point

  Quickly acquire the XRF spectrum with automated peak identification and labeling.

• Multi-Point Analysis

  If points are selected for multiple locations, the spectrum at each location can be collected automatically.

• XY Mapped Imaging

  Analyze a sample for its elemental distribution, over areas up to 10 cm x 10 cm.

• RGB Composite Image Generation

  Overlay elemental images to allow easy comparison of element distribution

• Line Analysis

  The XGT systems can also perform line analysis, which is effective for analyzing areas such as a sample cross-section.

• Phase Analysis (Option)

  Phase analysis is available as an optional function. With phase analysis, the various phases(variety of composition) of a sample are displayed in different colors, based on multiple element maps.

  This option is recommended for applications requiring material analysis.

• Matching Functions

  Data in the memory can be searched for spectra similar to the current analysis results, and the search results displayed in order of the degree of similarity. Saving data acquired from foreign substances makes it possible to quickly identify new substances.

• Report Generation

  Analytical results can be printed, with optical images, spectra, mapping images, and text freely arranged in the printing layout. Formats can be saved, allowing new reports to be easily created in the future.

  Automated report generation enables spectra and images to be quickly compiled and saved as one file.