• ICP/OES
• Glow Discharge
• Arc/Spark
• Inorganic Standards
  
  
  

 

• Raman
• PL
• FT-IR
• Ellipsometry
• Micro-XRF Elemental Analyzer
  
  

 

• Single Channel
• Multichannel Arrays
• OEM CCD and PDA Detectors
• Imaging CCD
  
  
  

 

• Raman Microscopy
• Micro-PL
• FT-IR
• Micro-XRF Elemental Analyzer
  
  
  

 

• Carbon/Sulfur
• Oxygen/Nitrogen & Hydrogen
• Sulfur-in-Oil
• Industrial XRF Analyzer
• Micro-XRF Analyzer
• WEEE/RoHS/ELV Compliance Testing

 

• Raman Microscopy
• Fluorescence
• Ellipsometry
  
  
  
  

 

• Laser Ellipsometers
• Spectroscopic Ellipsometers
• Large Area Metrology
  
  
  
  

 

• Particle Size Analyzers
• Elemental Particle Size Analyzers
  
  
  
  
  

 

• Carbon/Sulfur
• Oxygen/Nitrogen & Hydrogen
• Sulfur-in-Oil
• Industrial XRF Analyzer
• WEEE/RoHS/ELV compliance testing
  
  

 

• Optical Emission Spectroscopy
• Depth Targeting
• Deep Etch Control
• Cluster Tools
• Real Time Plasma Analysis
• Interface Detection

 

• Steady State
• Lifetime
• Nanotechnology
• Remote Sensing
• Process Monitoring
  
  

 

• Analytical/Microscopy
• Research/High Resolution
• Process/Industrial
• Modular Raman
  
  
  

 

• FLS - ALS Forensic Light Sources
• RUVIS - Fingerprint Imager
• Digital Imaging - Fingerprint Enhancement
• AFIS & APIS
• Analytical/Microscopy
• Analytical XRF Microscope

 

• Monochromators & Spectrographs
• Synchrotron Beamlines
• Mirrors & Gratings
• Slits
  
  
  

 

• Grating Catalog
• Grating Equations
• OEM
  
  
  
  

 

• Micro-XRF Elemental Analyzer
• Industrial XRF Analyzer
• WEEE/RoHS/ELV Compliance Testing
  
  
  
  

 

• Spectrometers & Monochromators
• Detectors
• Acquisition Controllers
• Sources
• Accessories
• Miniature CCD Spectrometers